New horizons in testing
latent trait test theory and computarized adaptative testing
Weiss, David J., ed.
text
xxu
New York
Academic Press
c1983
1983
monographic
eng
345 p. : il. ;
general
edited by David J. Weiss
xxu
MEDICION
153.9 N29
0127427805
CO-BoFKL
980101
000047