New horizons in testing : latent trait test theory and computarized adaptative testing / edited by David J. Weiss
Material type: TextLanguage: English Publisher: New York : Academic Press, c1983Description: 345 p. : ilISBN: 0127427805Subject(s): MEDICIONDDC classification: 153.9Item type | Current location | Collection | Call number | Status | Date due | Barcode |
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Libro | Biblioteca Juan Alberto Aragón Bateman | Colección Abierta | 153.9 / N29 (Browse shelf) | Available | 001811 |
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